Nanotechnology
OPTICAL COMPONENTS
- AFM Tips,Probes,Cantilevers
- Atom Probes
- Atomic Emission Spectrometers
- Atomic Force Microscopes(AFM)
- Atomic Layer Deposition(ALD) System
- Biomedical Atomic Force Microscopes(bio-AFM)
- Clorimeters
- Carrier Concentration Profiler
- CCD Cameras
- Coating and Deposition Equipment
- Control Systems
- Cryogenic Probe Stations
- Data Loggers
- Dynamic Light Scattering Instruments
- Electrical Conductivity Measurement System
- Electron Backscattered Diffraction (EBSD)System
- Ellipsometers
- Energy Dispersive X-Ray Spectroscopy(EDS)
- Flow Chemistry Reactors
- Focused Ion Beam(FIB) Accessories
- Focused Ion Beam(FIB) Systems
- FT-TR and FT-NIR Spectromrters
- Helium Ion Beam Microscopes(HIM)
- Induction Heating
- Micro Hardness Testers
- Microfluidic Device
- Micromehanical Testing
LASER SOURCES
- Microscopy Accessories” and Consumables
- Mills for reducing Particle size
- Moisture Analyres
- Nanofiber Production Equipment
- Nanoimprint Lighography Equipment
- Nanoimprint Lighography Templates
- Nanoindentation Testers
- Nanolithography Systems
- Nanoparticle Characterization Systems
- Nanopositioning Systems
- Optical characterization systems
- Optical Non-Contract Profilers
- Optical Tweezers
- Particle Size Analyzers
- Photoluminescene Mapper
- Piezo Actuators
- Plasma Cleaning Systems
- Plasma Etching Systems
- Profilometers
- Raman Spectrometers
- Safety Cabinets,Gloveboxes and Atmosphere Control
- Sample Preparation Equipment
- Scaning Electron Microscope(SEM) Accessories
- Scaning Electron Microscopes(SEM)
- Scaning Near-Field Optical Microscopes(SNOM)
- Scaning Probe Microscopes(SPM)
- Scientific Cameras
IMAGING & DETECTORS
- Scratch Testers
- Separation Membranes
- Spectroflurometers
- Spectrometers
- Spectrophotometers
- Spectroscopy Accesories
- Sputtering Systems
- Streak Cameras
- Surface Area Analyzer
- TEM Sample Holders and Supplies
- Thermal analysis Equipment
- Thin Film and Coating Thickness
- Thin Film DEposition Systems
- Time Delay Integration(TDI) Cameras
- Transmission Electron Microscopes
- Tribometers-Friction and Wear testers
- Ultrasonic Processing Equipment
- Vibrations Isolation Systems
- Viscometry/Rheometry
- Wafer Bonders
- X-Ray Cameras
- X-Ray Detectors
- X-Ray Diffractometers
- X-Ray Fluorescene Analyzers
- Zeta Potential Analyzers
- Classifields