Industrial, Military Defense and Oilfield Supplier Toronto Canada.

Focused Ion Beam (FIB) Systems

 

    Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them popular for a wide variety of applications including advanced circuit edit, and revealing below-the-surface defects in advanced materials and devices.



    For more information or to request a quote, please contact at (647) 271-3330 or email to support@firstchoicecanada.ca.

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