Industrial, Military Defense and Oilfield Supplier Toronto Canada.

Atomic Force Microscopes(AFM)

 

    Atomic force microscopes (AFM) are one of the most powerful tools for determining surface topography at subnanometer resolution. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm. The tip is held several nanometers above the surface using a feedback mechanism that measures surface–tip interactions on the scale of nanoNewtons. Variations in tip height are recorded while the tip is scanned repeatedly across the sample, producing a topographic image of the surface.



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